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Home > All Images > 2000 > July > 25 Jul 2000

Images Dated 25th July 2000

Choose from 13 pictures in our Images Dated 25th July 2000 collection for your Wall Art or Photo Gift. All professionally made for Quick Shipping.


Scanning electron microscope Featured 25 Jul 2000 Image

Scanning electron microscope

Scanning electron microscope. Sample stage (centre) of a combined scanning electron microscope (SEM), scanning auger microscope (SAM) and scanning probe microscope (SPM). The SEM scans a sample with a beam of electrons. The beam may be scattered off the sample or it may cause electrons to be emitted by it. These electrons are collected and translated into a three-dimensional image. The SAM can find the chemical composition of a sample on a microscopic scale. The SPM can image or alter material structures through the interaction of its probe with the material's surface. Photographed at the Centre for Nanoscale Science and Technology at the University of Newcastle upon Tyne, England

© COLIN CUTHBERT/SCIENCE PHOTO LIBRARY